Altmetric and the Institute of Electrical and Electronics Engineers (IEEE) have announced the integration of Altmetric badge visualizations and related data into the IEEE Xplore Digital Library, which is home to over 3.8 million scholarly documents. This interesting information came to us from Altmetric in their release, “Altmetric in the News.”
The inclusion of Altmetric badges enables authors, researchers, and other platform visitors to easily see a collated record of the online shares and discussion relating to individual articles from a variety of sources. This type of analytical information can help with future planning and strategy for highly sought after resources.
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Melody K. Smith
Sponsored by Access Innovations, the world leader in thesaurus, ontology, and taxonomy creation and metadata application.